Datasheets
5962-9172501MLA by: Texas Instruments

Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

Part Details for 5962-9172501MLA by Texas Instruments

Overview of 5962-9172501MLA by Texas Instruments

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Applications Industrial Automation Renewable Energy Robotics and Drones

Price & Stock for 5962-9172501MLA

Part # Distributor Description Stock Price Buy
Quest Components   27
  • 1 $60.0000
  • 10 $54.0000
  • 20 $51.0000
$51.0000 / $60.0000 Buy Now

Part Details for 5962-9172501MLA

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5962-9172501MLA Part Data Attributes

5962-9172501MLA Texas Instruments
Buy Now Datasheet
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5962-9172501MLA Texas Instruments Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
Pbfree Code Yes
Rohs Code No
Part Life Cycle Code Active
Ihs Manufacturer TEXAS INSTRUMENTS INC
Part Package Code DIP
Package Description DIP, DIP24,.3
Pin Count 24
Reach Compliance Code not_compliant
ECCN Code EAR99
HTS Code 8542.39.00.01
Control Type ENABLE LOW/HIGH
Count Direction UNIDIRECTIONAL
Family BCT/FBT
JESD-30 Code R-GDIP-T24
JESD-609 Code e0
Length 32.005 mm
Logic IC Type BOUNDARY SCAN BUS DRIVER
Max Frequency@Nom-Sup 20000000 Hz
Max I(ol) 0.064 A
Number of Bits 8
Number of Functions 8
Number of Ports 2
Number of Terminals 24
Operating Temperature-Max 125 °C
Operating Temperature-Min -55 °C
Output Characteristics 3-STATE
Output Polarity TRUE
Package Body Material CERAMIC, GLASS-SEALED
Package Code DIP
Package Equivalence Code DIP24,.3
Package Shape RECTANGULAR
Package Style IN-LINE
Packing Method TUBE
Power Supply Current-Max (ICC) 52 mA
Prop. Delay@Nom-Sup 9.5 ns
Propagation Delay (tpd) 11 ns
Qualification Status Qualified
Screening Level MIL-STD-883
Seated Height-Max 5.08 mm
Supply Voltage-Max (Vsup) 5.5 V
Supply Voltage-Min (Vsup) 4.5 V
Supply Voltage-Nom (Vsup) 5 V
Surface Mount NO
Technology BICMOS
Temperature Grade MILITARY
Terminal Finish TIN LEAD
Terminal Form THROUGH-HOLE
Terminal Pitch 2.54 mm
Terminal Position DUAL
Width 7.62 mm

Alternate Parts for 5962-9172501MLA

This table gives cross-reference parts and alternative options found for 5962-9172501MLA. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of 5962-9172501MLA, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

Part Number Description Manufacturer Compare
SNJ54BCT8373JT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDIP24 Texas Instruments 5962-9172501MLA vs SNJ54BCT8373JT
SNJ54BCT8373AJT Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125 Texas Instruments 5962-9172501MLA vs SNJ54BCT8373AJT
SN74BCT8373ANT Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24, 0.300 INCH, PLASTIC, DIP-24 Rochester Electronics LLC 5962-9172501MLA vs SN74BCT8373ANT
SN74BCT8373ANT IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 Texas Instruments 5962-9172501MLA vs SN74BCT8373ANT
Part Number Description Manufacturer Compare
SN74BCT8373ANT IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70 Texas Instruments 5962-9172501MLA vs SN74BCT8373ANT
SNJ54BCT8373AFK Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125 Texas Instruments 5962-9172501MLA vs SNJ54BCT8373AFK
SN74BCT8373ADW IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Texas Instruments 5962-9172501MLA vs SN74BCT8373ADW
SN54BCT8373AFK BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28, CERAMIC, CC-28 Texas Instruments 5962-9172501MLA vs SN54BCT8373AFK
SN54BCT8373AJT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDIP24, 0.300 INCH, CERAMIC, DIP-24 Texas Instruments 5962-9172501MLA vs SN54BCT8373AJT
5962-9172501M3X BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28, CERAMIC, LCC-28 Texas Instruments 5962-9172501MLA vs 5962-9172501M3X
SNJ54BCT8373FK BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28 Texas Instruments 5962-9172501MLA vs SNJ54BCT8373FK
SN54BCT8373FK BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28 Texas Instruments 5962-9172501MLA vs SN54BCT8373FK
SN74BCT8373ADWG4 BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24 Texas Instruments 5962-9172501MLA vs SN74BCT8373ADWG4
SN74BCT8373DW Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Texas Instruments 5962-9172501MLA vs SN74BCT8373DW

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