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IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
Tip: Data for a part may vary between manufacturers. You can filter for manufacturers on the top of the page next to the part image and part number.
Part # | Distributor | Description | Stock | Price | Buy | |
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DISTI #
2156-SN74BCT8240ADW-ND
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DigiKey | IC SCAN TEST DEVICE BUFF 24-SOIC Min Qty: 44 Lead time: 12 Weeks Container: Bulk MARKETPLACE PRODUCT |
1213 In Stock |
|
$6.8300 | Buy Now |
DISTI #
296-33846-5-ND
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DigiKey | IC SCAN TEST DEVICE BUFF 24-SOIC Min Qty: 44 Lead time: 12 Weeks Container: Tube | Temporarily Out of Stock |
|
$8.5018 | Buy Now |
DISTI #
595-SN74BCT8240ADW
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Mouser Electronics | Specialty Function Logic Device w/Octal Inverting Buffers RoHS: Compliant | 0 |
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$8.5000 | Order Now |
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Rochester Electronics | SN74BCT8240A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers RoHS: Compliant Status: Active Min Qty: 1 | 1213 |
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$5.8600 / $6.9000 | Buy Now |
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Ameya Holding Limited | SN74BCT8240ADW BCT, 8-Bit 三态 反相 缓冲器, 24针 SOIC封装 | 600 |
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RFQ |
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SN74BCT8240ADW
Texas Instruments
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Datasheet
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SN74BCT8240ADW
Texas Instruments
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
|
Pbfree Code | Yes | |
Rohs Code | Yes | |
Part Life Cycle Code | Active | |
Ihs Manufacturer | TEXAS INSTRUMENTS INC | |
Part Package Code | SOIC | |
Package Description | PLASTIC, SO-24 | |
Pin Count | 24 | |
Reach Compliance Code | compliant | |
ECCN Code | EAR99 | |
HTS Code | 8542.39.00.01 | |
Samacsys Manufacturer | Texas Instruments | |
Additional Feature | SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN | |
Control Type | ENABLE LOW | |
Count Direction | UNIDIRECTIONAL | |
Family | BCT/FBT | |
JESD-30 Code | R-PDSO-G24 | |
JESD-609 Code | e4 | |
Length | 15.4 mm | |
Logic IC Type | BOUNDARY SCAN BUS DRIVER | |
Max I(ol) | 0.064 A | |
Moisture Sensitivity Level | 1 | |
Number of Bits | 4 | |
Number of Functions | 8 | |
Number of Ports | 2 | |
Number of Terminals | 24 | |
Operating Temperature-Max | 70 °C | |
Operating Temperature-Min | ||
Output Characteristics | 3-STATE | |
Output Polarity | INVERTED | |
Package Body Material | PLASTIC/EPOXY | |
Package Code | SOP | |
Package Equivalence Code | SOP24,.4 | |
Package Shape | RECTANGULAR | |
Package Style | SMALL OUTLINE | |
Packing Method | TUBE | |
Peak Reflow Temperature (Cel) | 260 | |
Power Supply Current-Max (ICC) | 52 mA | |
Prop. Delay@Nom-Sup | 9 ns | |
Propagation Delay (tpd) | 8 ns | |
Qualification Status | Not Qualified | |
Seated Height-Max | 2.65 mm | |
Supply Voltage-Max (Vsup) | 5.5 V | |
Supply Voltage-Min (Vsup) | 4.5 V | |
Supply Voltage-Nom (Vsup) | 5 V | |
Surface Mount | YES | |
Technology | BICMOS | |
Temperature Grade | COMMERCIAL | |
Terminal Finish | NICKEL PALLADIUM GOLD | |
Terminal Form | GULL WING | |
Terminal Pitch | 1.27 mm | |
Terminal Position | DUAL | |
Time@Peak Reflow Temperature-Max (s) | 30 | |
Width | 7.5 mm |
This table gives cross-reference parts and alternative options found for SN74BCT8240ADW. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of SN74BCT8240ADW, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.
Part Number | Description | Manufacturer | Compare |
---|---|---|---|
SN74BCT8240ADWR | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, PLASTIC, SO-24 | Texas Instruments | SN74BCT8240ADW vs SN74BCT8240ADWR |
SN74BCT8240ADWRE4 | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, PLASTIC, SO-24 | Texas Instruments | SN74BCT8240ADW vs SN74BCT8240ADWRE4 |
SN74BCT8240ADWR | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, GREEN, PLASTIC, SOIC-24 | Rochester Electronics LLC | SN74BCT8240ADW vs SN74BCT8240ADWR |
SN74BCT8240ADWE4 | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 | Texas Instruments | SN74BCT8240ADW vs SN74BCT8240ADWE4 |
SN74BCT8240ADW | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, PLASTIC, SO-24 | Rochester Electronics LLC | SN74BCT8240ADW vs SN74BCT8240ADW |
SN74BCT8240ADWRG4 | BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, GREEN, PLASTIC, SOIC-24 | Texas Instruments | SN74BCT8240ADW vs SN74BCT8240ADWRG4 |