Datasheets
SNJ54BCT8240AFK by: Texas Instruments

Scan Test Devices With Octal Buffers 28-LCCC -55 to 125

Part Details for SNJ54BCT8240AFK by Texas Instruments

Overview of SNJ54BCT8240AFK by Texas Instruments

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Price & Stock for SNJ54BCT8240AFK

Part # Distributor Description Stock Price Buy
DISTI # 296-SNJ54BCT8240AFK-ND
DigiKey SCAN TEST DEVICES WITH OCTAL BUF Lead time: 20 Weeks Container: Tube Temporarily Out of Stock
Buy Now
Ameya Holding Limited   1935
RFQ

Part Details for SNJ54BCT8240AFK

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SNJ54BCT8240AFK Part Data Attributes

SNJ54BCT8240AFK Texas Instruments
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SNJ54BCT8240AFK Texas Instruments Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
Pbfree Code Yes
Rohs Code No
Part Life Cycle Code Active
Ihs Manufacturer TEXAS INSTRUMENTS INC
Part Package Code QLCC
Package Description QCCN, LCC28,.45SQ
Pin Count 28
Reach Compliance Code not_compliant
ECCN Code EAR99
HTS Code 8542.39.00.01
Additional Feature SUPPORTS IEEE STANDARD 1149.1-1990 BOUNDARY SCAN
Control Type ENABLE LOW
Count Direction UNIDIRECTIONAL
Family BCT/FBT
JESD-30 Code S-CQCC-N28
JESD-609 Code e0
Length 11.43 mm
Logic IC Type BOUNDARY SCAN BUS DRIVER
Max I(ol) 0.064 A
Number of Bits 4
Number of Functions 8
Number of Ports 2
Number of Terminals 28
Operating Temperature-Max 125 °C
Operating Temperature-Min -55 °C
Output Characteristics 3-STATE
Output Polarity INVERTED
Package Body Material CERAMIC, METAL-SEALED COFIRED
Package Code QCCN
Package Equivalence Code LCC28,.45SQ
Package Shape SQUARE
Package Style CHIP CARRIER
Packing Method TUBE
Power Supply Current-Max (ICC) 52 mA
Prop. Delay@Nom-Sup 9 ns
Propagation Delay (tpd) 9 ns
Qualification Status Not Qualified
Screening Level MIL-PRF-38535
Seated Height-Max 2.03 mm
Supply Voltage-Max (Vsup) 5.5 V
Supply Voltage-Min (Vsup) 4.5 V
Supply Voltage-Nom (Vsup) 5 V
Surface Mount YES
Technology BICMOS
Temperature Grade MILITARY
Terminal Finish TIN LEAD
Terminal Form NO LEAD
Terminal Pitch 1.27 mm
Terminal Position QUAD
Width 11.43 mm

Alternate Parts for SNJ54BCT8240AFK

This table gives cross-reference parts and alternative options found for SNJ54BCT8240AFK. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of SNJ54BCT8240AFK, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

Part Number Description Manufacturer Compare
SN54BCT8240AFKR BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CQCC28 Texas Instruments SNJ54BCT8240AFK vs SN54BCT8240AFKR
SNJ54BCT8240AFKR BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CQCC28, CERAMIC, LCC-28 Texas Instruments SNJ54BCT8240AFK vs SNJ54BCT8240AFKR
SN54BCT8240AFK BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CQCC28, CERAMIC, LCC-28 Texas Instruments SNJ54BCT8240AFK vs SN54BCT8240AFK
Part Number Description Manufacturer Compare
SN74BCT8240ADW BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, PLASTIC, SO-24 Rochester Electronics LLC SNJ54BCT8240AFK vs SN74BCT8240ADW
SN74BCT8240ADWE4 IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 Texas Instruments SNJ54BCT8240AFK vs SN74BCT8240ADWE4
SN74BCT8240ANT BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDIP24, 0.300 INCH, PLASTIC, DIP-24 Texas Instruments SNJ54BCT8240AFK vs SN74BCT8240ANT
SNJ54BCT8240AJT Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 Texas Instruments SNJ54BCT8240AFK vs SNJ54BCT8240AJT
SN74BCT8240ADWRG4 BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, GREEN, PLASTIC, SOIC-24 Texas Instruments SNJ54BCT8240AFK vs SN74BCT8240ADWRG4
SNJ54BCT8240AFKR BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CQCC28, CERAMIC, LCC-28 Texas Instruments SNJ54BCT8240AFK vs SNJ54BCT8240AFKR
SN54BCT8240AFK BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, CQCC28, CERAMIC, LCC-28 Texas Instruments SNJ54BCT8240AFK vs SN54BCT8240AFK
SN74BCT8240ADW IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70 Texas Instruments SNJ54BCT8240AFK vs SN74BCT8240ADW
SN74BCT8240ADWRE4 BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO24, PLASTIC, SO-24 Texas Instruments SNJ54BCT8240AFK vs SN74BCT8240ADWRE4
SN74BCT8240ANT BCT/FBT SERIES, DUAL 4-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDIP24, 0.300 INCH, PLASTIC, DIP-24 Rochester Electronics LLC SNJ54BCT8240AFK vs SN74BCT8240ANT

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